Measurement of the orbit fluctuation caused by an insertion device with the amplitude modulation method

Nakatani, Takeshi ; Agui, Akane; Yoshigoe, Akitaka ; Matsushita, Tomohiro*; Takao, Masaru*; Aoyagi, Hideki*; Takeuchi, Masao*; Tanaka, Hitoshi*

We have developed a new method to extract only the orbit fluctuation caused by changing magnetic field error of an insertion device (ID). This method consists of two main parts. (i) The orbit fluctuation is measured with modulating the error field of the ID by using the real-time beam position measuring system. (ii) The orbit fluctuation depending on the variation of the error field of the ID is extracted by the filter applying the Wavelet Transform. We call this approach the amplitude modulation method. This analysis technique was applied to measure the orbit fluctuation caused by the error field of APPLE-2 type undulator (ID23) installed in the SPring-8 storage ring. We quantitatively measured two kinds of the orbit fluctuation which are the static term caused by the magnetic field error and the dynamic term caused by the eddy current on the ID23 chamber.