Measurement of orbit fluctuation caused by APPLE-2 undulator phase motion and the correction table depending on its phase position

Nakatani, Takeshi ; Agui, Akane; Yoshigoe, Akitaka ; Matsushita, Tomohiro*; Takao, Masaru*; Takeuchi, Masao*; Aoyagi, Hideki*; Tanaka, Hitoshi*

We observed two characteristic electron orbit fluctuations caused when the phase of ID23 (APPLE-2 type undulator) installed at SPring-8 was driven. One was caused by the variation of magnetic error filed of ID23 when the phase was driven. The other was caused by the noise from the phase drive system which adoped AC servomotors. We measured these orbit fluctuations synchronized with the phase motion using the real-time electron beam position measurement system. The part of the orbit fluctuation was supressed by the correction table which was made referring to the obtained data.