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3-45MeV/u ion beam dosimetry using thin film dosimeters

Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki*; Hanaya, Hiroaki; Tachibana, Hiroyuki*

Four kinds of film dosimeters well-characterized for low LET radiations were applied to 3-45 MeV/u ions. The dose responses relative to those for low LET radiations are almost one up to about 10 MeV/(mg/cm$$^{2}$$) and gradually become smaller with increase of the stopping power. Overall uncertainty in ion beam dosimetry using these characterized dosimeters is better than $$pm$$5%(1$$sigma$$) including uncertainty in fluence measurement($$pm$$2%). Lateral and depth dose profile measurements were achievable using characterized Gafchromic dosimeters with the spatial resolution of better than 1 and 10 $$mu$$m, respectively.

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Category:Chemistry, Physical

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