Bulk modulus measurement of carbon nitride thin films by the X-ray diffraction under high pressure

Kamijo, Eiji*; Aoi, Yoshifumi*; Hisa, Masaaki*; Utsumi, Wataru; Watanuki, Tetsu; Yamaguchi, Koji*

no abstracts in English

Language	:	English
Journal	:	Diamond and Other Carbon Materials 3
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Pages	:	p.97 - 104
Publication Year/Month	:	2003/05
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Keywords	:	薄膜; 窒化炭素; 硬質材料; 放射光; X線回折; 体積弾性率
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Registration No. : A20040290
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