Time-resolved laser and ion microbeam studies of single event transients in high-speed optoelectronic devices

Laird, J. S.; Hirao, Toshio; Onoda, Shinobu; Wakasa, Takeshi; Yamakawa, Takeshi; Abe, Hiroshi; Kamiya, Tomihiro; Ito, Hisayoshi

no abstracts in English

Language	:	English
Journal	:	Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6)
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Pages	:	p.125 - 129
Publication Year/Month	:	2004/10
Meeting title	:	6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6)
Held date	:	2004/10
Location (city)	:	Tsukuba
Location (country)	:	Japan
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DOI for research data	:
Keywords	:	オプトエレクトロニックデバイス; イオン照射; レーザー照射; 過渡応答; 空間電荷効果; フォトダイオード
Research Facility	:	TIARA(イオン照射研究施設)
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Article of JAEA R&D Review	:
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Registration No. : B20041359
JAEA Abstracts No. : 47001742
Paper Submission No. : 22341

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