Evaluation of transient current induced by high energy charged particles in Si PIN photodiode

Onoda, Shinobu; Hirao, Toshio; Laird, J. S.; Wakasa, Takeshi; Yamakawa, Takeshi; Okamoto, Tsuyoshi*; Koizumi, Yoshiharu*; Kamiya, Tomihiro; Ito, Hisayoshi

no abstracts in English

Language	:	English
Journal	:	Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6)
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Pages	:	p.173 - 176
Publication Year/Month	:	2004/10
Meeting title	:	6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6)
Held date	:	2004/10
Location (city)	:	Tsukuba
Location (country)	:	Japan
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DOI for research data	:
Keywords	:	シングルイベント過渡電流; PINフォトダイオード; ビットエラー; 高エネルギー陽子照射; 核反応; 弾性散乱
Research Facility	:	TIARA(イオン照射研究施設)
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Article of JAEA R&D Review	:
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Registration No. : B20041353
JAEA Abstracts No. : 47001746
Paper Submission No. : 22345

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