Electron optical conditions for the formation of structure images of silicon oriented in (110)

not registered

no abstracts in English

Language	:	English
Journal	:	Japanese Journal of Applied Physics
Volume	:	19
Number	:	5
Pages	:	p.799 - 806
Publication Year/Month	:	1980/00
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Paper URL	:	https://doi.org/10.1143/JJAP.19.799
DOI for research data	:	Link to research data related to this paper/report.
Keywords	:	Electron Microscopy; Multi-slice Method; Structure Image of Crystal; Chromatic Aberration; Electron Microscope; Dynamical Theory of Electron Diffraction; Fourier Transform; Excitation Error; Spherical Aberration
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Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:20.47 Category:Physics, Applied
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Registration No. : A19799088
JAEA Abstracts No. :
Paper Submission No. : 5702

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