A New high-resolution small-angle X-ray scattering apparatus using a fine-focus rotating anode,point-focusing collimation and a position-sensitive proportional counter

not registered

no abstracts in English

Language	:	English
Journal	:	Journal of Applied Crystallography
Volume	:	17
Number	:
Pages	:	p.337 - 343
Publication Year/Month	:	1984/00
Meeting title	:
Held date	:
Location (city)	:
Location (country)	:
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1107/S0021889884011614
DOI for research data	:
Keywords	:	X-ray; Small-angle Scattering; Apparatus; Point-focusing; PSPC
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:63.47 Category:Chemistry, Multidisciplinary
Altmetrics	:

Registration No. : A19833492
JAEA Abstracts No. :
Paper Submission No. : 7250

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.