X-ray diffraction topographic observation of Si single crystals irradiated with 150 MeV Ni $^{+}$ $^{9}$ and Cl $^{+}$ $^{9}$ ions

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no abstracts in English

Language	:	English
Journal	:	Japanese Journal of Applied Physics
Volume	:	22
Number	:	11
Pages	:	p.674 - 676
Publication Year/Month	:	1983/00
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Paper URL	:	https://doi.org/10.1143/JJAP.22.674
DOI for research data	:
Keywords	:	XDT; Si Crystal; Ni $^{+}$ $^{9}$ Ion; Cl $^{+}$ $^{9}$ Ion; Radiation; Tandem Accelarator; Lattice Strain; Ion Range; Damage
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Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
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Registration No. : A19833312
JAEA Abstracts No. :
Paper Submission No. : 6870

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X-ray diffraction topographic observation of Si single crystals irradiated with 150 MeV Ni and Cl ions

X-ray diffraction topographic observation of Si single crystals irradiated with 150 MeV Ni $^{+}$ $^{9}$ and Cl $^{+}$ $^{9}$ ions