Basic study on the development of low exposure CT with Frisch grid avalanche diode, JAERI's nuclear research promotion program, H13-011 (Contract research)

Imanishi, Nobutsugu*; Ito, Akio*; Kanno, Ikuo*; Yoshida, Koji*; Onabe, Hideaki*

no abstracts in English

Language	:	Japanese
Report No.	:	JAERI-Tech 2005-007
Pages	:	45 Pages
Publication Year/Month	:	2005/03
Patent information	:
PDF	:	JAERI-Tech-2005-007.pdf:6.84MB
Paper URL	:	https://doi.org/10.11484/jaeri-tech-2005-007
Keywords	:	低被爆CT; X線検出器; Frischグリッド; 半導体検出器; Sipn接合; 表面活性化法; フィルターX線; 差分法
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	京都大学
Other institute's report number	:

Acecsses	:	- Accesses
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Registration No. : T20050007
JAEA Abstracts No. : 330252

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