X-ray and fourier transformed infrared investigation of -SiC growth by ion Implantation

Zhang, Z.; Narumi, Kazumasa; Naramoto, Hiroshi; Yamamoto, Shunya; Miyashita, Atsumi

no abstracts in English

Language	:	English
Journal	:	Journal of Physics D; Applied Physics
Volume	:	32
Number	:	17
Pages	:	p.2236 - 2240
Publication Year/Month	:	1999/09
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Paper URL	:	https://doi.org/10.1088/0022-3727/32/17/313
DOI for research data	:
Keywords	:	-SiC; Implantation; X-ray Diffraction; Infrared Absorption
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Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:55.07 Category:Physics, Applied
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Registration No. : A19990390
JAEA Abstracts No. : 47000207
Paper Submission No. : 20884

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