A New model to simulate critical current degradation of a large CICC by taking into account strand bending

Koizumi, Norikiyo; Nunoya, Yoshihiko; Okuno, Kiyoshi

no abstracts in English

Language	:	English
Journal	:	IEEE Transactions on Applied Superconductivity
Volume	:	16
Number	:	2
Pages	:	p.831 - 834
Publication Year/Month	:	2006/06
Meeting title	:	19th International Conference on Magnet Technology (MT-19)
Held date	:	2005/09
Location (city)	:	Genova
Location (country)	:	Italy
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1109/TASC.2005.869640
DOI for research data	:
Keywords	:	CICC; Nb $_{3}$ Sn; Critical Current; n Index; Degradation
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

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Registration No. : B20042159
JAEA Abstracts No. : 34001291
Paper Submission No. : 1460

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