Mach-Zehnder interference microscopy using a highly coherent X-ray laser

Nishikino, Masaharu; Kawazome, Hayato; Tanaka, Momoko; Kishimoto, Maki; Hasegawa, Noboru; Ochi, Yoshihiro; Kawachi, Tetsuya; Nagashima, Keisuke

no abstracts in English

Language	:	English
Journal	:	IPAP Conference Series 7 (Proceedings of 8th International Conference on X-ray Microscopy (XRM 2005))
Volume	:
Number	:
Pages	:	p.423 - 425
Publication Year/Month	:	2005/00
Meeting title	:	8th International Conference on X-ray Microscopy (XRM 2005)
Held date	:	2005/07
Location (city)	:	Himeji
Location (country)	:	Japan
Patent information	:
PDF	:
Paper URL	:
DOI for research data	:
Keywords	:	X線レーザー; 干渉計測; 空間コヒーレンス
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:
Altmetrics	:

Registration No. : B20050466
JAEA Abstracts No. : 47001734
Paper Submission No. : 22333

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.