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Structural changes in anatase TiO$$_{2}$$ thin films irradiated with high-energy heavy ions

Ishikawa, Norito   ; Yamamoto, Shunya; Chimi, Yasuhiro

Electronic excitation effects on TiO$$_{2}$$ thin films with anatase structure irradiated with 230MeV Xe ions have been studied by means of X-ray diffraction method. X-ray diffraction intensity shows exponential decrease as a function of ion-fluence, indicating that tracks having about 10nm diameter are introduced by the irradiation. Rutile structured TiO$$_{2}$$ was also irradiated and exhibited different damage behavior from that of anatase one. We demonstrated that X-ray diffraction meathod is one of the powerful tool to investigate track structure.

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