Focused microbeam formation for heavy ion beam from AVF cyclotron

Yokota, Wataru; Sato, Takahiro; Oikawa, Masakazu*; Sakai, Takuro; Okumura, Susumu; Kurashima, Satoshi; Miyawaki, Nobumasa; Kashiwagi, Hirotsugu; Fukuda, Mitsuhiro

no abstracts in English

Language	:	English
Journal	:	JAEA-Review 2005-001, TIARA Annual Report 2004
Volume	:
Number	:
Pages	:	p.291 - 292
Publication Year/Month	:	2006/01
Meeting title	:	第14回TIARA研究発表会
Held date	:	2005/06
Location (city)	:	高崎
Location (country)	:	日本
Patent information	:
PDF	:
Paper URL	:	https://jopss.jaea.go.jp/pdfdata/JAEA-Review-2005-001-p0001-p0126.pdf
DOI for research data	:
Keywords	:	Above a Hundred MeV; Heavy Ion; Microbeam; Focus; 1m; Flat-top Acceleration; TIARA; AVF Cyclotron
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

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Registration No. : B20051257
JAEA Abstracts No. :
Paper Submission No. : 665

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