Design and manufacture of a testing device for the evaluation of optical elements

Shimizu, Yuichi; Yoda, Osamu; Sasuga, Tsuneo*; Teraoka, Yuden; Yokoya, Akinari; Yanagihara, Mihiro*

no abstracts in English

Language	:	Japanese
Report No.	:	JAERI-Tech 2000-021
Pages	:	p.45 - 0
Publication Year/Month	:	2000/03
Patent information	:
PDF	:	JAERI-Tech-2000-021.pdf:3.01MB
Paper URL	:	https://doi.org/10.11484/jaeri-tech-2000-021
Keywords	:	X線レーザー; 軟X線; 光学素子; 多層膜; 反射率; 耐熱性; 放射光X線; 評価試験装置; 設計・製作; 設置・調整
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Registration No. : T20000021
JAEA Abstracts No. : 280171

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