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Cross-sectional transmission electron microscopy of interface structure of $$beta$$-FeSi$$_2$$/Si(100) prepared by ion beam sputter deposition

Sasase, Masato*; Shimura, Kenichiro*; Yamamoto, Hiroyuki; Yamaguchi, Kenji; Shamoto, Shinichi  ; Hojo, Kiichi

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Category:Physics, Applied

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