Improvement in beam quality of the JAEA AVF cyclotron for focusing heavy-ion beams with energies of hundreds of MeV

Kurashima, Satoshi; Miyawaki, Nobumasa; Okumura, Susumu; Oikawa, Masakazu*; Yoshida, Kenichi; Kamiya, Tomihiro; Fukuda, Mitsuhiro*; Sato, Takahiro; Nara, Takayuki; Agematsu, Takashi; Ishibori, Ikuo; Yokota, Wataru; Nakamura, Yoshiteru

no abstracts in English

Language	:	English
Journal	:	Nuclear Instruments and Methods in Physics Research B
Volume	:	260
Number	:	1
Pages	:	p.65 - 70
Publication Year/Month	:	2007/07
Meeting title	:	10th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA 2006)
Held date	:	2006/07
Location (city)	:	Singapore
Location (country)	:	Singapore
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/j.nimb.2007.01.278
DOI for research data	:
Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:59.1 Category:Instruments & Instrumentation
Altmetrics	:

Registration No. : BB20060275
JAEA Abstracts No. : 35001058
Paper Submission No. : 2623

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.