Language |
: | English |
---|---|---|
Journal |
: | |
Volume |
: | 53 |
Number |
: | 6 |
Pages |
: | p.3731 - 3737 |
Publication Year/Month |
: | 2006/12 |
Meeting title |
: | 2006 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2006) |
Held date |
: | 2006/07 |
Location (city) |
: | Florida |
Location (country) |
: | U.S.A. |
Paper URL |
: |
|
Keywords |
: | no keyword |
Research Facility |
: | |
Article of JAEA R&D Review |
: | Detection of Electric Circuit Malfunction Caused by Galactic Cosmic Rays; Mechanism of Transient Current Induced by High Energy Heavy Ions in Semiconductor Devices[ |
Accesses |
: |
- Accesses |
---|---|---|
InCites™ |
: |
Percentile:71.84 Category:Engineering, Electrical & Electronic |
Altmetrics |
: |
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