Growth kinetics of very thin oxide on Si and Ti surfaces studied by real-time surface analytical methods

Takakuwa, Yuji*; Ogawa, Shuichi*; Ishizuka, Shinji*; Yoshigoe, Akitaka ; Teraoka, Yuden

no abstracts in English

Language	:	Japanese
Journal	:	Journal of Surface Analysis
Volume	:	13
Number	:	1
Pages	:	p.36 - 84
Publication Year/Month	:	2006/04
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Keywords	:	no keyword
Research Facility	:	SPring-8(大型放射光施設)
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Article of JAEA R&D Review	:
Cooperating Institute	:	東北大学多元物質科学研究所

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Registration No. : AA20060254
JAEA Abstracts No. : 35001221
Paper Submission No. : 2811

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