Effects of and heavy ion damage on the impulse response and pulsed gain of a low breakdown voltage Si avalanche photodiode

Laird, J. S.*; Onoda, Shinobu; Hirao, Toshio; Ito, Hisayoshi; Becker, H.*; Johnston, A.*

no abstracts in English

Language	:	English
Journal	:	IEEE Transactions on Nuclear Science
Volume	:	53
Number	:	6
Pages	:	p.3786 - 3793
Publication Year/Month	:	2006/12
Meeting title	:	2006 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2006)
Held date	:	2006/07
Location (city)	:	Florida
Location (country)	:	U.S.A.
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1109/TNS.2006.886042
DOI for research data	:
Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:56.98 Category:Engineering, Electrical & Electronic
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Registration No. : BB20063260
JAEA Abstracts No. : 35000737
Paper Submission No. : 2224

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