Change in the electrical characteristics of p-channel 6H-SiC MOSFET by -ray irradiation

Hishiki, Shigeomi; Oshima, Takeshi; Iwamoto, Naoya; Kawano, Katsuyasu*; Ito, Hisayoshi

no abstracts in English

Language	:	Japanese
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Meeting title	:	2006年秋季第67回応用物理学会学術講演会
Held date	:	2006/08
Location (city)	:	草津
Location (country)	:	日本
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Keywords	:	no keyword
Research Facility	:	コバルト60照射施設
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Registration No. : BB20061486
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