Bias dependence of the single event transient currents due to nuclear products in semiconductors

Onoda, Shinobu; Hirao, Toshio; Abe, Hiroshi; Sanami, Toshiya*; Ito, Hisayoshi

no abstracts in English

Language	:	English
Journal	:	JAEA-Review 2006-042, JAEA Takasaki Annual Report 2005
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Pages	:	P. 9
Publication Year/Month	:	2007/02
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Paper URL	:	https://jopss.jaea.go.jp/pdfdata/JAEA-Review-2006-042.pdf
DOI for research data	:
Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
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Article of JAEA R&D Review	:
Cooperating Institute	:	高エネルギー加速器研究機構

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Registration No. : AA20060640
JAEA Abstracts No. :
Paper Submission No. : 2373

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