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Soft-hard X-ray photoemission study of Ce-based Kondo semiconductor

Takeda, Yukiharu   ; Fujimori, Shinichi   ; Okane, Tetsuo  ; Saito, Yuji  ; Yamagami, Hiroshi; Kobayashi, Keisuke*; Inami, Toshiya; Owada, Kenji; Arita, Masashi*; Shimada, Kenya*; Namatame, Hirofumi*; Takabatake, Toshiro*

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