Effects of and heavy ion damage on the time-resolved gain of a low breakdown voltage Si avalanche photodiode

Laird, J. S.*; Onoda, Shinobu; Hirao, Toshio; Becker, H.*; Johnston, A.*; Ito, Hisayoshi

no abstracts in English

Language	:	English
Journal	:	Proceedings of 7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-7)
Volume	:
Number	:
Pages	:	p.37 - 40
Publication Year/Month	:	2006/10
Meeting title	:	7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-7)
Held date	:	2006/10
Location (city)	:	Takasaki
Location (country)	:	Japan
Patent information	:
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Paper URL	:
DOI for research data	:
Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
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Accesses	:	- Accesses
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Registration No. : BB20063315
JAEA Abstracts No. : 35000691
Paper Submission No. : 2180

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