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Effects of ripple-induced ion thermal transport on H-mode plasma performance

リップルに誘発された熱化イオン輸送がHモードプラズマ性能に与える影響

L$"o$nnroth, J.-S.*; Parail, V.*; Hyn$"o$nen, V.*; Johnson, T.*; Kiviniemi, T.*; 大山 直幸; Beurskens, M.*; Howell, D.*; Saibene, G.*; de Vries, P.*; 波多江 仰紀; 鎌田 裕; Konovalov, S.*; Loarte, A.*; 篠原 孝司; 飛田 健次; 浦野 創; JET-EFDA Contributors*

L$"o$nnroth, J.-S.*; Parail, V.*; Hyn$"o$nen, V.*; Johnson, T.*; Kiviniemi, T.*; Oyama, Naoyuki; Beurskens, M.*; Howell, D.*; Saibene, G.*; de Vries, P.*; Hatae, Takaki; Kamada, Yutaka; Konovalov, S.*; Loarte, A.*; Shinohara, Koji; Tobita, Kenji; Urano, Hajime; JET-EFDA Contributors*

JET/JT-60U比較実験の結果をMHD安定性の観点から説明できるかどうか試みた結果、実験結果を再現することはできなかった。そこで、リップル損失がHモード性能に与える影響について調べた結果、熱化イオンのリップル損失がHモードプラズマの性能に敏感に影響を与えることがわかった。軌道追跡計算の結果、拡散的な輸送は径方向に広範囲に渡るイオン熱拡散係数に影響を与えること、非拡散的な輸送は周辺部に局在していることがわかった。非拡散的な損失に対応するエネルギーのシンク項を導入したシミュレーションコードを用いて、ELM周波数の増加とペデスタル性能の劣化を再現することができた。

It is investigated whether differences in the MHD stability of the pedestal, including effects of plasma rotation and aspect ratio, can explain the results of JET/JT-60U similarity experiments. As a result, these mechanisms fail to explain the experimental observations. Therefore, the effects of ripple losses on H-mode performance were investigated. The analysis shows that ripple losses of thermal ions can affect H-mode plasma performance very sensitively. Orbit-following simulations indicate that losses due to diffusive transport give rise to a wide radial distribution of enhanced ion thermal transport, whereas non-diffusive losses have a very edge-localized distribution. In predictive transport simulations with an energy sink term in the continuity equation for the ion pressure representing non-diffusive losses, reduced performance as well as an increase in the ELM frequency are demonstrated.

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パーセンタイル:55.27

分野:Physics, Fluids & Plasmas

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