Nagoshi, Masayasu*; Kawano, Takashi*; Makiishi, Noriko*; Baba, Yuji 
; Kobayashi, Katsumi*
Grazing incidence X-ray photoelectron spectroscopy (XPS) has been applied to mirror-polished stainless steel sheets and Si-wafer using incident X-ray with high energy from synchrotron radiation. Monochromatized X-ray with the energy of 1.8 keV to 3.6 keV was irradiated to the sample surfaces with various incident angles. Total reflection condition with the high-energy incident X-ray provides us X-ray photoelectron spectra having remarkably low background intensity. The results will be compared with background calculations in previous researches and discussed in terms of the penetration depth of X-ray and inelastic mean free path of photoelectrons. We also discuss the depth information of the obtained spectra.
Language |
: | English |
|---|---|---|
Journal |
: | |
Volume |
: | 40 |
Number |
: | 3-4 |
Pages |
: | p.738 - 740 |
Publication Year/Month |
: | 2008/04 |
Meeting title |
: | 12th European Conference on Applications of Surface and Interface Analysis (ECASIA 2007) |
Held date |
: | 2007/09 |
Location (city) |
: | Brussels |
Location (country) |
: | Belgium |
Paper URL |
: |
|
Keywords |
: | no keyword |
Cooperating Institute |
: |
Accesses |
: |
- Accesses |
|---|---|---|
InCites™ |
: |
Percentile:7.02 Category:Chemistry, Physical |
Altmetrics |
: |
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