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Charge excitations in high-$$T_c$$ cuprates studied by resonant inelastic X-ray scattering

Ishii, Kenji

Resonant inelastic X-ray scattering (RIXS) in the hard X-ray regime is a new spectroscopic technique to measure electronic excitations utilizing brilliant synchrotron radiation. It has the great advantage that the momentum dependence can be measured unlike conventional optical methods. We have installed an IXS spectrometer at BL11XU of SPring-8 and have applied RIXS technique to strongly correlated electron systems in order to understand the electronic structure and underlying correlation effects. Here, I would like to present our RIXS studies on high-$$T_c$$ cuprates and related materials which were performed in close collaboration with theorists. Momentum and carrier-doping dependence of the excitations will be discussed.



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