Bias dependence of the single event transient currents due to nuclear products in semiconductors, 2

Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi; Kaneko, Hirohisa; Sanami, Toshiya*

no abstracts in English

Language	:	Japanese
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Meeting title	:	第2回高崎量子応用研究シンポジウム
Held date	:	2007/06
Location (city)	:	高崎
Location (country)	:	日本
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Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
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Article of JAEA R&D Review	:
Cooperating Institute	:	高エネルギー加速器研究機構

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Registration No. : BB20070301
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