Planar doping of crystalline fullerene with cobalt

Lavrentiev, V.*; Naramoto, Hiroshi*; Narumi, Kazumasa; Sakai, Seiji; Avramov, P.

A study of 100 keV Co $^{+}$ -implanted C $_{60}$ films with Rutherford Backscattering and Raman spectroscopy has revealed the pronounced cobalt translation from the surface layer of amorphous carbon into the deeper crystalline fullerene due to post-implantation annealing at 300 $^{circ}$ C. Carbon density gradient along the film depth is discussed as a driving force of this effect. Cobalt deficit in the doped fullerene layer, detected by means of ion beam analysis, suggests ionization of the C $_{60}$ molecules under the collisions with 2 MeV He $^{+}$ ions.

Language	:	English
Journal	:	Chemical Physics Letters
Volume	:	423
Number	:	4-6
Pages	:	p.366 - 370
Publication Year/Month	:	2006/06
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Paper URL	:	https://doi.org/10.1016/j.cplett.2006.03.087
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Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
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Registration No. : AA20070272
JAEA Abstracts No. : 35000998
Paper Submission No. : 2555

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