Impact of Auger recombination on charge collection of a 6H-SiC diode by heavy ions

Onoda, Shinobu; Oshima, Takeshi; Hirao, Toshio; Mishima, Kenta; Hishiki, Shigeomi; Iwamoto, Naoya; Kawano, Katsuyasu*

no abstracts in English

Language	:	English
Journal	:	IEEE Transactions on Nuclear Science
Volume	:	54
Number	:	6
Pages	:	p.2706 - 2713
Publication Year/Month	:	2007/12
Meeting title	:
Held date	:
Location (city)	:
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Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1109/TNS.2007.908459
DOI for research data	:
Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
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Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:72.04 Category:Engineering, Electrical & Electronic
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Registration No. : AA20070076
JAEA Abstracts No. : 36000667
Paper Submission No. : 3929

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