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Diffusion of $$^{8}$$Li short-lived radiotracer in Li ionic conductors of NaTl-type intermetallic compounds

Sugai, Hiroyuki; Sataka, Masao; Okayasu, Satoru ; Ichikawa, Shinichi; Nishio, Katsuhisa  ; Mitsuoka, Shinichi; Nakanoya, Takamitsu ; Osa, Akihiko ; Sato, Tetsuya  ; Hashimoto, Takashi; Jeong, S.-C.*; Katayama, Ichiro*; Kawakami, Hirokane*; Watanabe, Yutaka*; Ishiyama, Hironobu*; Imai, Nobuaki*; Hirayama, Yoshikazu*; Miyatake, Hiroari; Hashimoto, Takanori*; Yahagi, Masahito*

A non-destructive and on-line diffusion tracing in Li ionic conductors has been successfully conducted by using the short-lived $$alpha$$-emitting radiotracer of $$^{8}$$Li. The radiotracers produced as an energetic and pulsed ion beam are implanted into the Li ionic conductor of NaTl-type intermetallic compounds ($$beta$$-LiAl, $$beta$$-LiGa, and $$beta$$-LiIn). The $$alpha$$-particles survived on their passage from the position emitted by the diffusing $$^{8}$$Li to the surface of the specimen are measured as a function of time. The diffusion coefficients of Li obtained for the NaTl-type intermetallic compounds with different Li compositions are quantitatively discussed in terms of the interaction between the structural defects in the specimen and Li.

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