Study of the radiation damage effect in the commercial devices

Oyama, Hidenori*; Hayama, Kiyoteru*; Takakura, Kenichiro*; Hirao, Toshio; Onoda, Shinobu; Oshima, Takeshi; Kuboyama, Satoshi*; Arai, Manabu*

no abstracts in English

Language	:	Japanese
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Meeting title	:	第2回高崎量子応用研究シンポジウム
Held date	:	2007/06
Location (city)	:	高崎
Location (country)	:	日本
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DOI for research data	:	Link to research data related to this paper/report.
Keywords	:	no keyword
Research Facility	:	電子加速器
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Cooperating Institute	:	熊本電波工業高等専門学校

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Registration No. : BB20071347
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