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Report No.

Developments at JAEA AVF cyclotron facility for heavy-ion microbeam

Kurashima, Satoshi; Okumura, Susumu; Miyawaki, Nobumasa; Ishibori, Ikuo; Yoshida, Kenichi; Sato, Takahiro; Kashiwagi, Hirotsugu; Yuri, Yosuke; Agematsu, Takashi; Nara, Takayuki; Kamiya, Tomihiro; Yokota, Wataru; Oikawa, Masakazu*; Fukuda, Mitsuhiro*

We have been improving the beam quality of the JAEA (Japan Atomic Energy Agency) AVF cyclotron to form a several-hundred-MeV heavy-ion microbeam by a magnetic focusing lens. An energy spread ${it $Delta$E/E}$ of the order of 10$$^{-3}$$, obtained by ordinary acceleration using a fundamental dee voltage, makes it difficult to focus an ion beam to a spot size of 1 $$mu$$m in diameter with focusing lens because of the chromatic aberration. A flat-top acceleration system using the fifth-harmonic frequency of the acceleration frequency was installed in the cyclotron in order to reduce ${it $Delta$E/E}$ to the order of 10$$^{-4}$$. In addition, developments of a new center region, an energy spread measurement system using an analyzing magnet and a high performance beam buncher are in progress. The energy spread of the 260 MeV $$^{20}$$Ne$$^{7+}$$ beam has been reduced to 0.05% by the flat-top acceleration, and the microbeam with a spot size of approximately 1 $$mu$$m has been successfully formed.



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