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Study of structural change in CeO$$_{2}$$ irradiated with high-energy ions by means of X-ray diffraction measurement

Ishikawa, Norito   ; Chimi, Yasuhiro; Michikami, Osamu*; Ota, Yasuyuki*; Ohara, Kota; Lang, M.*; Neumann, R.*

Cerium dioxide films are irradiated with high-energy heavy ions with the energy range of 150 MeV to 2.7 GeV, and X-ray diffraction profile is examined. As a result, the data can be explained by creation of nanometer-size ion track with disordered lattice structure, and the ion track is oxygen deficient.

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Category:Instruments & Instrumentation

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