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Effect of energy relaxation of H$$^{0}$$ atoms at the wall on the production profile of H$$^{-}$$ ions in large negative ion sources

Takado, Naoyuki*; Matsushita, Daisuke*; Fujino, Ikuro*; Hatayama, Akiyoshi*; Tobari, Hiroyuki; Inoue, Takashi

Production and transport process of the H$$^{0}$$ atoms are numerically simulated using a three-dimensional Monte Carlo transport code. The code was applied to the "JAEA 10 ampere negative ion source" under Cs-seeded condition to obtain a spatial distribution of surface-produced H$$^{0}$$ ions. In this analysis, we focus on the effect of the energy relaxation of the H$$^{0}$$ atoms at the wall on the H$$^{-}$$ ion production from the H$$^{0}$$ atoms. The result indicates that, by considering the energy relaxation of the H$$^{0}$$ atoms at the wall, the production profile of the surface-produced H$$^{-}$$ ion is well reflected in the production profile of the H$$^{0}$$ atom production.

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