Structural studies of disordered materials using high-energy X-ray diffraction from ambient to extreme conditions

Kohara, Shinji*; Ito, Masayoshi*; Suzuya, Kentaro; Inamura, Yasuhiro; Sakurai, Yoshiharu*; Oishi, Yasuo*; Takata, Masaki*

High-energy X-rays from synchrotron radiation source allow us to measure high-quality diffraction data of the disordered materials from under ambient condition to an extreme condition, which is necessary to reveal the detailed structure of glass, liquid, and amorphous materials. We introduce the high-energy X-ray diffraction beamlines and dedicated diffractometer for glass, liquid, and amorphous materials at SPring-8 and report the recent developments of ancillary equipments. Furthermore the structures of liquid and amorphous materials based on high-energy X-ray diffraction data are discussed.