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Enhancement of double auger decay probability in xenon clusters irradiated with a soft-X-ray laser pulse

Namba, Shinichi*; Hasegawa, Noboru; Nishikino, Masaharu; Kawachi, Tetsuya; Kishimoto, Maki; Sukegawa, Kota; Tanaka, Momoko; Ochi, Yoshihiro; Takiyama, Ken*; Nagashima, Keisuke

The interaction of large Xe clusters with a soft X-ray laser pulse having a wavelength of 13.9 nm and an intensity of up to 2$$times$$10$$^{10}$$W/cm$$^{2}$$ was investigated using a time-of-flight ion mass spectrometer. It was found that Xe$$^{3+}$$ ions (which result from double Auger decay of 4d vacancies) became the dominant final ionic product with increasing cluster size and X-ray intensity. This is in contrast to the results of synchrotron radiation experiments involving free Xe atoms, in which Xe$$^{2+}$$ is the dominant resultant ion species. Possible mechanisms responsible for the enhancement of the double Auger transition probability in X-ray laser and cluster interaction are discussed.

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Category:Physics, Multidisciplinary

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