Outline design specification of a new polarized neutron reflectometer proposed for materials and life science facility at J-PARC

Takeda, Masayasu  ; Yamazaki, Dai  ; Soyama, Kazuhiko  ; Hirano, Tatsumi*

The X-ray and neutron reflectometries have now widely used for the study of depth profiles of various thin films and multilayers. In addition, the technique gives information on in-plane structures of various surfaces and buried interfaces by analysis of off-specular reflection profiles. Such structural information in the vicinity of interfaces is often a clue to elucidate the origin of new phenomena appearing in artificial multilayers and to develop the high performance devises with the layered structure in which the interface plays an essential role in the function. We propose a polarized neutron reflectometer for JSNS to investigate the magnetic multilayers, following increasing interest in interfacial magnetism which has a close relation to the function of the magnetic recording devices. The outline design specification of this new polarized neutron reflectometer will be presented.