Enhancement effect in photon-stimulated ion desorption for benzene adsorbed on silicon surfaces observed using angle-dependent technique

Sekiguchi, Tetsuhiro  ; Ikeura, Hiromi*; Baba, Yuji  

We have constructed a novel rotatable time-of-flight (TOF) mass detector for desorbed fragment-ions produced by irradiation of synchrotron radiation (SR). This makes the best use of advantages in synchrotron, including variable X-ray energy, linear polarization, and pulsed capability. The detector allows us to measure excitation-energy dependences of desorbing ion yields from solid surfaces in a variety of incident angles of X-ray beams. We propose that this angle-dependent technique provides insights into orientation of chemical bonds lying at the top surface. The present paper reports our recent findings that the mass-patterns and yields of desorbed ions drastically depend on the incident angles less than 10 degrees. The results suggest that direct desorption mechanism prevails in extremely small angles and indirect desorption mechanism induced through collision excitation by secondary electrons is suppressed.