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Sensitive measurement of OH yield with fluorescent probe, 2; Evaluation of temporal behavior of OH yield after high-energy heavy-ion irradiation

Maeyama, Takuya*; Yamashita, Shinichi; Baldacchino, G.*; Taguchi, Mitsumasa; Kimura, Atsushi; Katsumura, Yosuke; Murakami, Takeshi*

no abstracts in English

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