Oscillation photography applied to resonant X-ray diffraction

Inami, Toshiya; Toyokawa, Hidenori*; Terada, Noriki*; Kitazawa, Hideaki*

Recently resonant X-ray diffraction has been used for detecting charge, magnetic and multipole orders. However, this technique practically surveys only a small portion of the reciprocal space. In this paper, we applied oscillation photography to resonant X-ray diffraction. For a test sample, we explored nearly a whole Brillouin zone and successfully observed resonant peaks. This feasibility study indicates that oscillation photography is useful for expanding observable areas and enhances capability of resonant X-ray diffraction.