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Transient void behavior in simulation tests for cold shutdown reactivity initiated accidents, 2

Satou, Akira ; Maruyama, Yu ; Asaka, Hideaki*; Nakamura, Hideo  

Simulation tests for cold shutdown reactivity initiated accidents were conducted in single-rod and 2$$times$$2 bundle systems. Transient void behavior was measured using two kinds of test sections different in thermal equivalent diameter for each systems. It has been found that the thermal equivalent diameter was not a dominant factor for the transient characteristics of void fraction.

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