Study on the microstructure of swift heavy ion irradiated CeO $_{2}$ by means of syncrotron radiation X-ray photoelectron spectroscopy and Ce K-edge EXAFS spectroscopy

Iwase, Akihiro*; Ono, Hirotaka*; Matsumura, Daiju ; Nishihata, Yasuo; Mizuki, Junichiro; Ishikawa, Norito ; Baba, Yuji ; Hirao, Norie; Sonoda, Takeshi*; Kinoshita, Motoyasu*

To study the effects of swift heavy ion irradiation in cerium dioxide, the samples were irradiated with 200MeV Xe. The irradiated samples were analyzed by EXAFS measurement and XPS measurement.

Language	:	English
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Meeting title	:	7th International Symposium on Swift Heavy Ions in Matter (SHIM 2008)
Held date	:	2008/06
Location (city)	:	Lyon
Location (country)	:	France
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Keywords	:	no keyword
Research Facility	:	タンデム加速器
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Article of JAEA R&D Review	:
Cooperating Institute	:	文部科学省

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Registration No. : BB20081364
JAEA Abstracts No. :
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Study on the microstructure of swift heavy ion irradiated CeO by means of syncrotron radiation X-ray photoelectron spectroscopy and Ce K-edge EXAFS spectroscopy

Study on the microstructure of swift heavy ion irradiated CeO $_{2}$ by means of syncrotron radiation X-ray photoelectron spectroscopy and Ce K-edge EXAFS spectroscopy