Development of soft X-ray fourier transform holography with fresnel zone plate

Nishikino, Masaharu; Yamatani, Hiroshi; Nagashima, Keisuke; Kawachi, Tetsuya

The focused X-ray beam with a high intensity and a micron-order scale is expected to open various fields, such as the nonlinear phenomena, the nanoscale structuring of semiconductor material, and the X-ray probing of a single biological cell. A submicron soft X-ray beam is generated by a highly coherent soft X-ray laser at 13.9 nm with a Fresnel phase zone plate (FZP). The focused X-ray beam profile is measured using a knife-edge scan method. The submicron X-ray beam can also be used as the X-ray source of the Fourier transform holography. The FZP generates a point reference source and works as a beam splitter. The transmitted 0th order beam illuminates the object directly. A Fourier transform hologram is generated by the interference between the object wave diffracted from the object and the spherical reference wave. The holograms of the wire and the grid pattern are recorded with a CCD camera. The spatial resolution of the hologram will be presented.