Charge collection properties of 6H-SiC diodes by wide variety of charged particles up to several hundreds MeV

Onoda, Shinobu; Iwamoto, Naoya; Murakami, Makoto; Oshima, Takeshi; Hirao, Toshio; Kojima, Kazutoshi*; Kawano, Katsuyasu*; Nakano, Itsuo*

no abstracts in English

Language	:	English
Journal	:	Materials Science Forum
Volume	:	615-617
Number	:
Pages	:	p.861 - 864
Publication Year/Month	:	2009/00
Meeting title	:	7th European Conference on Silicon Carbide and Related Materials (ECSCRM 2008)
Held date	:	2008/09
Location (city)	:	Barcelona
Location (country)	:	Spain
Patent information	:
PDF	:
Paper URL	:
DOI for research data	:
Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	岡山大学; 産業技術総合研究所

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:
Altmetrics	:

Registration No. : BB20081260
JAEA Abstracts No. : 37000510
Paper Submission No. : 5507

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.