Radiation-induced transient-pulses in logic LSIs for use in space applications

Makino, Takahiro*; Yanagawa, Yoshimitsu*; Kobayashi, Daisuke*; Fukuda, Seisuke*; Hirose, Kazuyuki*; Ikeda, Hirokazu*; Saito, Hirobumi*; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi; Takahashi, Daisuke*; Ishii, Shigeru*; Kusano, Masaki*; Ikebuchi, Hiroshi*; Kuroda, Yoshikatsu*

SET pulse-widths were measured as a function of LET by using pulse capture circuits. In addition, a scan flip-flop (FF) is designed to observe both single event transient (SET) and single event upset (SEU) soft errors in logic VLSI system.

Language	:	Japanese
Journal	:	Shingaku Giho
Volume	:	108
Number	:	100
Pages	:	p.67 - 72
Publication Year/Month	:	2008/06
Meeting title	:	電子情報通信学会宇宙・航行エレクトロニクス研究会(SANE)
Held date	:	2008/06
Location (city)	:	つくば
Location (country)	:	日本
Patent information	:
PDF	:
Paper URL	:	https://www.ieice.org/ken/paper/20080626VaEv/
DOI for research data	:
Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	宇宙航空研究開発機構

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Registration No. : BB20081670
JAEA Abstracts No. :
Paper Submission No. : 24811

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