As-rich InAs(001)-(24) phases investigated by surface X-ray diffraction

その場表面X線回折によるAs終端InAs(001)-(24)相

Tinkham, B. P.*; Braun, W.*; Ploog, K. H.*; 高橋 正光; 水木 純一郎; Grosse, F.*

Tinkham, B. P.*; Braun, W.*; Ploog, K. H.*; Takahashi, Masamitsu; Mizuki, Junichiro; Grosse, F.*

Surface X-ray diffraction has been employed, in situ, to measure InAs(001)-(24) surface phases under technologically relevant growth conditions. For the As-rich (24) phase, the authors obtain good agreement between the data and the 2(24) surface reconstruction model. Comparison of our measurements on the (24) phase measured close to the metal-rich phase transition to models from density functional theory suggests a mixture of 2(24) and 2(24) surface structures present on the surface.