Measurement of sensitivity of microbeam system to zinc and platinum using standard sample made of ion exchange resin

Iwata, Yoshihiro*; Ishii, Keizo*; Yokota, Wataru; Kamiya, Tomihiro; Sato, Takahiro; Oikawa, Masakazu*

no abstracts in English

Language	:	Japanese
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Meeting title	:	第25回PIXEシンポジウム
Held date	:	2008/09
Location (city)	:	前橋
Location (country)	:	日本
Patent information	:
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DOI for research data	:
Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	東北大学; 秋田大学

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Registration No. : BB20082549
JAEA Abstracts No. :
Paper Submission No. :

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