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Development of imaging and quality assessment of X-ray laser focal spot and investigations of LiF crystals colorization thresholds

イメージの開発とエックス線レーザ焦点のスポットの品質アセスメントとLiF結晶カラー化敷居の調査

Faenov, A. Y.; 福田 祐仁; Pikuz, T. A.*; Bulanov, S. V.; 田中 桃子; 岸本 牧; 石野 雅彦; 加藤 義章* ; 河内 哲哉

Faenov, A. Y.; Fukuda, Yuji; Pikuz, T. A.*; Bulanov, S. V.; Tanaka, Momoko; Kishimoto, Maki; Ishino, Masahiko; Kato, Yoshiaki*; Kawachi, Tetsuya

A new single shot method of imaging and quality assessment of X-ray laser beam focal spot has been developed. Due to high dynamic range of used LiF crystal detector and its high spatial resolution the tiny structures inside the X-ray laser focal spot with sizes about 1 micron was clear observed. The LiF crystal colorization threshold was measured.

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